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ABES-V

Automatic Burn-In/Environmental Systems for Logic and Memory Devices

Shown as a 32-board, hot-only, oven. Click here for different oven configurations.

ABES-V Features

  • Memory and logic testing capabilities
• Large system capacity of up to 32 burn-in boards
• Up to 256 digital I/O channels per burn-in board
• Up to 130 amps of programmable power to the devices under test (5 separate voltages)
• 12 vector formats per pin per cycle.
• 1-nanosecond clock resolution.
• Boolean address scambling.
• 2K real-time error log.
• 8 sets of timing on the fly.
• 8 analog generators per burn-in board (optional)
• Optional high-power burn-in for devices up to 20 Watts. HPB-1 option
To request literature about the ABES-V click here!