HPB-5

• Individual temperature control for each device under test up to 35 watts.
• Up to 128 I/O channels per driver/receiver.
• Tests devices at a maximum temperature of 150° C.
• 8 on-the-fly timing sets.
• 11 programmable voltage regulators per BIB.
• 600 amps of DUT power available per burn-in board.
• Programmable temperature control up to 150° C.
• ASIC architecture for per-pin timing, testing, and formatting of pattern data.
• System capacity with individual temperature control is up to 384 devices. When individual temperature control is not a requirement, capacity increases based on the size of the devices.