Industry Firsts

Micro Control Company prides itself with leading the industry in providing unique solutions to test and burn-in-with-test challenges. Over the years, Micro Control Company has been the first to bring these innovative designs to market, carving a niche for itself as the test…with burn-in company.

1973 - First microprocessor-controlled test system.
1974 - First single-range programmable clock edges.
1976 - First memory burn-in test system with algorithmic pattern generation.
1977 - First system able to test for alpha particle sensitivity.
1981 - First large-scale 10-MHz memory burn-in test system (6912 devices).
1984 - First parallel memory burn-in test system (1728 devices tested simultaneously).
1986 - First 15-MHz environmental test system.
1989 - First 256-pin I/O burn-in test system for VLSI devices.
1991 - First logic burn-in system using ASIC technology.
1992 - First burn-in system using weighted random patterns.
1994 - First memory burn-in and test systems using ASICs.
1997 - First large-scale high-power burn-in system.
1997 - First massively parallel memory test system used in manufacturing for batch testing.
1998 - First 200 MHz memory test system.
1999 - First burn-in with test system for 200-watt devices with individual temperature control provided to each device.
2001 - First air-cooled burn-in with test system for 75-watt devices with individual temperature control for each device.
2001 - First burn-in with test system capable of full testing of logic and memory devices.
2004 - First burn-in with test system for 600-watt devices with individual temperature control.
2005 - First air-cooled burn-in with test system for 150-watt devices with individual temperature control for each device and an individual pattern zone per burn-in board.
2008 - First low cost burn-in system with individual temperature control.