- Individual temperature control for each device up to 600 W
- Test devices at a maximum temperature of 150°C with a liquid-cooled heat-sink per device.
- Programmable clocks with leading and trailing edges per pin, one-nanosecond resolution, and 8 on-the-fly timing sets.
- System capacity of 14 burn-in boards (112 devices)
- 12 vector formats per-pin per-cycle with memory testing extensions
- 128 I/O signals per board
- High-speed clock range of 2 to 400 MHz
- 64M vector memory, 8G scan
- 19 programmable voltage regulators provide 2060 amps of device current per burn-in board
- 16 high-current supplies
- (0-3.2 Volts up to 125 Amps each)
- 3 low-current supplies
- (0-6 Volts up to 20 Amps each)
Features:
Benefits:
- Testing capabilities for high-power devices
- Ensures proper thermal stress for each device
- Measures device temperature more accurately
- Testing is more cost-effective due to greater system capacity resulting in higher throughputs
- Exercise and test high pin count devices or more parts in parallel
- Run large numbers of test vectors without time-consuming reloads
- Up to 2000 Watts of device under test power available per slot
- Translate and run device test programs
- Clock devices with built-in self-test (BIST) at high speed
- Flexibility to test complex devices
Location
Micro Control Company
- 7956 Main Street NE
Minneapolis, Minnesota 55432 - Local: 763-786-8750
Toll-Free: 1-800-328-9923