Harold Hamilton founded Micro Control Company in 1972 as a manufacturer of test equipment for the electronics industry. The microprocessor-controlled test system produced in 1973 was the first in the industry. Today, the tradition continues with Micro Control Company’s high-power burn-in and test systems which are being shipped to customers throughout the world.
Along with high-power burn-in systems for logic and memory applications, Micro Control Company designs and builds burn-in boards and other burn-in accessories for use during reliability or production burn-in applications.
Why Micro Control Company?
In the 50 years since Micro Control Company was established, a commitment to high quality products has always remained a top priority. We strive to exceed our customers needs by creating an environment focused on excellence. Each and every employee is committed to innovation and improvement. Every system and burn-in board is made from the highest quality components and is rigorously tested prior to shipment.
Here at Micro Control Company, we place a premium on customer service; helping you achieve your goals allows us to achieve ours. From your first sales inquiry to post-install, our team seeks to help you understand and get the most out of your burn-in with test system.
Focus on Engineering
Unique solutions through innovative designs allows Micro Control Company to continue to meet the challenges of the semiconductor industry. At the center of our operations, a talented team of engineers provide the knowledge and experience to meet customer-specific application requirements. By working together, we will find the right burn-in solution to meet your needs.
Micro Control Company prides itself on leading the industry in providing unique solutions to test and burn-in with test challenges. Over the years, Micro Control Company has been the first to bring these innovative designs to market, carving a niche for itself as the test with burn-in company.
Discover Our History
First microprocessor-controlled test system is created by Micro Control Company founder, Harold Hamilton.
First single-range programmable clock edges.
First memory burn-in test system with algorithmic pattern generation.
First system able to test for alpha particle sensitivity.
First large-scale 10-MHz memory burn-in test system (6,912 devices).
First parallel memory burn-in test system (1,728 devices tested simultaneously).
First 15-MHz environmental test system.
First 256-pin I/O burn-in test system for VLSI devices.
First logic burn-in system using ASIC technology.
First burn-in system using weighted random patterns.
First memory burn-in and test systems using ASICs.
First large-scale high-power burn-in system.
First massively parallel memory test system used in manufacturing for batch testing.
First 200 MHz memory test system.
First burn-in test system for 200-watt devices with individual temperature control provided to each device.
First air-cooled burn-in with test system for 75-watt devices with individual temperature control for each device.
First burn-in with test system capable of full testing of logic and memory devices.
First burn-in with test system for 600-watt devices with individual temperature control.
First air-cooled burn-in with test system for 150-watt devices with individual temperature control for each device and an individual pattern zone per burn-in board.
First low cost burn-in system with individual temperature control.
125 Amp regulators
HPB-4 High Force trays
+- 150 Volt regulators
1,000 Volt LC2 applications
HPB-5C+ system is released.
First fully automatic system is released; the LC-2 Automation system.
LC-2+ system is released.