HPB-6
Ultra High-Power Burn-In with Test System
The only advanced, high-performance burn-in system capable of performing dynamic burn-in with test on 1000-watt devices. The HPB-6 High-Power Burn-In with Test system is ideally suited for production screening, engineering characterization, and lifetime testing applications of logic devices and multi-die packages.
HPB-6
Meeting the Challenge of High-Power Device Burn-In
Features:
- Handle devices up to 1000 watts
- Water-cooled, high-force sockets for individual temperature control per device
- 16 independent burn-in board slots
- 24 high-power individually programable power supplies (250 W, 175 A, 0.3V to 1.8V) per board
- 24 low-power individually programable power supplies (60 W, 15 A, 0.3V to 4.0V) per board
- 64M standard and 128M optional parallel vector depth – subroutine capable
- 8G scan vector depth
- 128 formatted vector I/O channels plus 128 vector output-only channels
- 100 MHz fast scan mode rep-rate on 16 dedicated channels
- 8 programmable high-frequency clocks, up to 350 MHz – LVDS to the BiB
- Standalone chiller for easy maintenance
Benefits:
- High number of regulated power supplies for isolating circuits inside the DUT
- Highest DUT power available for burn-in
- Device temperature is maintained throughout test ensuring accurate readings
- Ensures proper thermal stress for each device
- Exercise and test high pin count devices or more parts in parallel
- High current regulators to supply required power to DUTs
- Translate and run device test programs
- Multiple clocks available for self-test
- Test both logic and memory functions
- Run large numbers of test vectors without time-consuming reloads
