TSL Representing Micro Control Company in the Republic of Korea Beginning January 1st, 2024

December 21, 2023 Micro Control Company and Du-sung Technology have amicably ended their sales and service representation agreement for the Republic of Korea effective December 31, 2023. Those of us at Micro Control Company have profound respect for Mr. Kang and Du-sung Technology, and we look forward to continuing our business relationship through other avenues […]

Product End of Life Announcement for Windows 7 and Python 2.7/3.7

Product Notification: End of Life Announcement Windows 7 and Python 2.7/3.7 Support End Date: March 1, 2024 Release Date: December 18, 2023 Micro Control Company will no longer be supporting Windows 7 Operating Systems or Python 2.7/3.7, and in addition, Micro Control’s C-Breez software running on those versions is no longer supported. It is recommended […]

Exhibiting at SEMICON Korea 2024

(Minneapolis, MN) Micro Control Company announces that we will be exhibiting with at SEMICON Korea 2024 held at COEX in Seoul, Korea from January 31 – February 2.  Visit our booth to see the latest innovation in high-power burn-in with test.   Micro Control Company is the industry leader in high-power burn-in systems with individual […]

Exhibiting at Productronica 2023

FOR IMMEDIATE RELEASE – October 18, 2023 (Minneapolis, MN) Micro Control Company announces that we will be exhibiting at Productronica 2023 held in Munich, Germany from November 14-17, 2023.  Stop by Hall A1 Stand 329 to see the latest innovation in high-power burn-in with test. With more than 50 years of experience in the electronics […]

High-Power Burn-In System For 1000-Watt Devices

FOR IMMEDIATE RELEASE – June 14, 2023 (Minneapolis, MN) Micro Control Company announces the release of the HPB-6 High-Power Logic Burn-In with Test System. The HPB-6 is Micro Control Company’s most advanced, high-performance burn-in with test system capable of performing dynamic burn-in with test on extremely high-power devices up to 1000 watts. Featuring individual temperature […]