LC-3
The Future of Burn-In
The LC-3 is a sophisticated burn-in-with-test system that manages advanced requirements through its ability to perform dynamic burn-in with test. The LC-3 burn-in system is designed for production burn-in of logic, mixed signal, analog, and memory devices. With 50% more power supplies than an HPB-5C, double the number of temperature control channels than an LC-2 and up to 32 user-defined independent pattern zones, the LC-3 is the future of burn-in.
LC-3
Sophisticated Burn-In System Ready for Production Requirements
Features:
- Individual temperature control per device under test for 48 20-watt devices per BIB. (80 watts for fewer devices)
- Programmable chamber control up to 150°C and individual temperature control to 175°C.
- 24 total power supplies per BIB; 544A and 2240W available per BIB; limited to 1000W.
- 16 high power individually programmable power supplies (30A, .5V to 9.5V, 120W) per BIB.
- 8 low power individually programmable power supplies (8A, .25V to 5.0V, 40W) per BIB.
- Analog voltage supplies are optional.
- Up to 32 patterns/power zones.
- 128 formatted vector I/O channels and 128 unformatted BIB input only channels.
- Compatible with other Micro Control Company burn-in systems.
- Adaptable to industry standard BIBs.
- Runs on Micro Control Company’s C-Breez software, using vectors compatible with both the LC-2 and HPB-5C
Benefits:
- Ensures proper thermal stress for up to 50W DUTs
- Enables high-volume production burn-in at the same time
- Allows use of existing burn-in boards
- Burn-in multiple device types at the same time
- Exercise and test more devices in parallel
- Stress at optimum temperature
- Programming flexibility
- Test both logic and memory functions
- Run test vectors without time-consuming reloads
- Flexible DUT power
