1973 -
First microprocessor-controlled test system. |
1974 -
First single-range programmable clock edges. |
1976 -
First memory burn-in test system with algorithmic pattern generation. |
1977 -
First system able to test for alpha particle sensitivity. |
1981 -
First large-scale 10-MHz memory burn-in test system (6912 devices). |
1984 -
First parallel memory burn-in test system (1728 devices tested
simultaneously). |
1986 -
First 15-MHz environmental test system. |
1989 -
First 256-pin I/O burn-in test system for VLSI devices. |
1991 -
First logic burn-in system using ASIC technology. |
1992 -
First burn-in system using weighted random patterns. |
1994 -
First memory burn-in and test systems using ASICs. |
1997 -
First large scale high-power burn-in system. |
1997 -
First massively parallel memory test system used in manufacturing
for batch testing. |
1998 -
First 200 MHz memory test system. |
1999 -
First burn-in with test system for 200-watt devices with individual
temperature control provided to each device. |
2001 -
First 75 watt air-cooled burn-in with test system for individual
temperature control for each device. |
2001 -
First burn-in with test system capable of full testing of logic
and memory devices. |
2004 -
First burn-in with test system for 600-watt devices with individual
temperature control. |
2005 - First 150 watt air-cooled burn-in with
test system for individual temperature control for each device
and a separate pattern zone per slot. |
2007 - First low cost burn-in system with full-testing
capabilities. |
