ASICs and custom silicon devices are designed to perform functions that off-the-shelf components can’t, which makes them valuable and makes their failure especially costly. These devices often operate in demanding environments and may have limited sourcing alternatives. Burn-in with test supports ASIC devices by providing controlled stress exposure that helps identify latent defects before devices are deployed, particularly in builds where the cost of a missed failure is highest.
Key Specifications
- Burn-in strategies tailored to specific device architecture, power profile, and operating environment
- Applied during early production screening, qualification builds, and risk-based devices
- Supports low-to-moderate volume devices with extended burn-in requirements
- Flexible system configuration accommodates unique and evolving device requirements