Applications / Application-Specific Integrated Circuit (ASIC) & Custom Silicon

Application-Specific Integrated Circuit (ASIC) & Custom Silicon

Custom silicon devices represent significant engineering investment. Burn-in with test for application-specific integrated circuits helps protect your investment by identifying reliability risks before devices are integrated into final systems.

Close-up of a dark blue computer circuit board with illuminated processor chips and electronic components.

ASICs and custom silicon devices are designed to perform functions that off-the-shelf components can’t, which makes them valuable and makes their failure especially costly. These devices often operate in demanding environments and may have limited sourcing alternatives. Burn-in with test supports ASIC devices by providing controlled stress exposure that helps identify latent defects before devices are deployed, particularly in builds where the cost of a missed failure is highest.

Key Specifications

  • Burn-in strategies tailored to specific device architecture, power profile, and operating environment
  • Applied during early production screening, qualification builds, and risk-based devices
  • Supports low-to-moderate volume devices with extended burn-in requirements
  • Flexible system configuration accommodates unique and evolving device requirements

Key Statistics

$85B

AI ASIC market projected by 2030

37%

AI accelerator market CAGR through 2032

$10M–$50M+

Typical advanced node NRE investment

Key Features & Benefits

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Custom Devices Carry Unique Reliability Risks

Unlike standard semiconductor products, ASICs often operate near their design limits, incorporate novel architectures, and may have no direct equivalent in the market. That uniqueness is what makes them valuable, and it’s also what makes early-life failures so costly. A field failure in a custom silicon device can mean redesigns, root-cause investigations, and device delays that no organization wants.

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Burn-In Conditions Built Handle Your Device

Off-the-shelf burn-in approaches aren’t always appropriate for custom silicon. Micro Control’s engineering team works with ASIC customers to define burn-in conditions based on actual device characteristics, power dissipation, electrical behavior, intended operating environment, rather than applying generic settings that may not fit the application and intended operating environment to conduct the most thorough and valuable testing possible, rather than applying generic setting that may not appropriately test the application’s limits.

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Supports Engineering and Production Workflows

ASIC devices often involve burn-in at two distinct stages: engineering builds during qualification and early production lots during the manufacturing ramp. Micro Control’s systems are designed to support both contexts, with the configurability to adapt as device designs mature and volume requirements evolve.

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Flexibility for Devices That Keep Evolving

Custom silicon doesn’t stand still; next-generation designs introduce new power profiles, new packaging, and new operating requirements. Micro Control’s burn-in systems are designed with that reality in mind, providing the configurability to adapt to new device requirements without requiring a full system replacement.

Burn-In With Test Built Around Your Device

Every custom silicon device is different. Micro Control works with ASIC customers to define burn-in strategies that fit their specific device, their production environment, and their reliability objectives.

Relevant Systems

HPB-6

A high-power burn-in with test system with individual temperature control per device, engineered for devices up to 1,000 watts. A turnkey automation solution that scales from a single cell to a full production line.

HPB-5C

The HPB-5C is an industry standard, one of Micro Control's most proven, versatile burn-in with test system trusted by manufacturers worldwide. Air-cooled with individual temperature control per device, it keeps testing floors running dependably across legacy and current production.

LC-FLEX

A flexible, LC-2-compatible burn-in with test system with individual temperature control for devices up to 50 watts. A custom adapter board runs BIBs from other systems and manufacturers, bridging past, current, and future requirements.

LC-3

The LC-3 system is a production-ready burn-in with test system for logic, mixed signal, analog, and memory devices. Combines dynamic burn-in with test, expanded power and temperature control, and cold burn-in capability in one platform.

LC-2 V Series

A burn-in with test system designed to maximize your existing board infrastructure. An adapter-based approach lowers cost-of-test, shortens design cycles, and runs legacy and next-generation hardware together.