Applications / Defense & Aerospace

Defense & Aerospace

In defense and aerospace applications, failure isn’t just costly; it can be catastrophic. Burn-in with test supports the rigorous reliability validation that mission-critical devices demand.

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Defense and aerospace semiconductor devices operate in some of the harshest environments imaginable: extreme temperatures, vibration, radiation, altitude, and continuous operation over years or even decades. And in most cases, if something fails after deployment, the options for repair or replacement are limited or nonexistent. Burn-in with test plays a role in defense and aerospace reliability devices by helping identify latent device-level defects before components are integrated into systems where a single failure can compromise a mission or endanger a crew.

Key Specifications

  • Applied during device qualification, production screening, and long-duration reliability evaluation
  • Supports MIL-STD and customer-defined qualification requirements
  • Applicable to avionics, navigation, radar, communications, and space systems
  • Burn-in strategies tailored to device criticality, operating environment, and device requirements

Key Statistics

$13.4B

Defense semiconductor market in 2025

11%

Projected annual market growth through 2035

2 Decades

Expected operational life of deployed systems

Key Features & Benefits

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The Consequences of Field Failures Are Unique in This Industry

A field failure in a consumer device is a warranty claim. A field failure in a defense or aerospace system can mean a grounded aircraft, a compromised mission, or loss of hardware that cannot be recovered. The reliability expectations in high-pressure situations and more consequential circumstances that govern these devices exist for good reason, and burn-in with test is one of the tools that helps meet them.

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Designed for Low-Volume, High-Criticality Devices

Defense and aerospace devices don’t look like consumer electronics production. Volumes may be lower, burn-in durations longer, and documentation requirements more rigorous. Micro Control’s systems and engineering team are experienced in supporting these device characteristics, providing the consistency and repeatability that mission-critical applications require.

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Support for the Most Demanding Standards

MIL-STD-883 and customer-defined qualification specifications set a high bar for defense and aerospace semiconductor reliability. Micro Control helps customers ensure their burn-in configuration and documentation are aligned with those requirements, so the process is defensible at every level of device review.

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Electrical and Thermal Stress at the Device Level

Defense and aerospace validation programs cover a lot of ground: environmental testing, functional verification, and qualification testing, but sustained electrical and thermal stress at the device level is a distinct discipline. Burn-in applies controlled voltage and temperature conditions over extended durations, targeting the marginal electrical characteristics and latent defects that environmental and functional tests aren’t designed to find. In applications where every failure mechanism matters, that specificity is what makes it valuable.

Burn-In With Test for When Failure Isn't an Option

Micro Control supports burn-in with test devices for defense and aerospace semiconductor applications, from engineering qualification through production screening.

Relevant Systems

LC-FLEX

A flexible, LC-2-compatible burn-in with test system with individual temperature control for devices up to 50 watts. A custom adapter board runs BIBs from other systems and manufacturers, bridging past, current, and future requirements.

LC-3

The LC-3 system is a production-ready burn-in with test system for logic, mixed signal, analog, and memory devices. Combines dynamic burn-in with test, expanded power and temperature control, and cold burn-in capability in one platform.

LC-2 V Series

A burn-in with test system designed to maximize your existing board infrastructure. An adapter-based approach lowers cost-of-test, shortens design cycles, and runs legacy and next-generation hardware together.

Learn More About Our Burn-In Solutions For Defense Devices