Use this single-board (one-slot) engineering development station to bring the full test electronics and device cooling of the LC-FLEX to the bench. Built for developing test programs, validating boards, and troubleshooting one board at a time.
| Research & development | On devices |
| Testing | Single-board |
| Design | Open, for easy access to test points |
| Signal analysis | Scoping signals on burn-in boards |
| Test programs | Designing and debugging |
| Troubleshooting | Burn-in boards |
| Diagnostics | Running diagnostic tests |
| System compatibility | Use with an accompanying burn-in system, same design configuration |
A flexible, LC-2-compatible burn-in with test system with individual temperature control for devices up to 50 watts. A custom adapter board runs BIBs from other systems and manufacturers, bridging past, current, and future requirements.
Designed by engineers and PCB designers experienced in multi-layer board layouts. Each LC-FLEX board is designed for the device under test and the customer's specific requirements. The device size and complexity determine how many fit per board.
A manually operated mobile cart for transporting BIBs between your LC-FLEX systems and EDS.
A connected complete setup of automated loading, mobile robotics, and burn-in systems working as one. Cross platform software synchronizes every handoff, scaling from a single cell to full production.
Burn-in with Individual temperature control (ITC) is the most important development in burn-in technology.
Burn-in is the process that applies elevated temperatures and high voltages to accelerate conditions that will stress semiconductors during what is known as their infant mortality period.
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