Application / Automotive

Automotive

Automotive devices spend a decade or more in some of the most demanding conditions on earth. Burn-in with test helps make sure they’re ready long before they reach the vehicle.

A glowing blue car icon with a Wi-Fi symbol on a computer circuit board.

Automotive semiconductor devices, from ECUs and ADAS processors to battery management and powertrain control, are needed to operate across wide temperature ranges, under sustained electrical load, and for the full life of the vehicle. These devices need to be relied upon often for a decade or longer in specific applications that require exceptional functionality for safety and minimizing failure. Burn-in with test supports automotive devices by helping identify early-life device failures before components are integrated into vehicle systems, reducing the downstream risk of warranty claims, recalls, and the kind of scrutiny no manufacturer wants.

Key Specifications

  • Supports qualification and production screening workflows across automotive device types
  • Aligned to JEDEC, AEC-Q100, and customer-defined reliability specifications
  • Applicable to ECUs, ADAS, powertrain, battery management, and body electronics

Key Statistics

$74B → $117B

Semiconductor market growth to 2030

1,200+

Semiconductor chips in a modern vehicle

$6.7B

Cost of a single major automotive recall

Key Features & Benefits

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Early-Life Failures in Automotive Have Serious Consequences

A device that fails shortly after vehicle delivery can trigger warranty claims, recalls, and regulatory attention. The cost of a single automotive quality event, in financial terms, reputational terms, and supply chain disruption, is almost always far greater than the cost of rigorous production screening. Burn-in is one of the tools that keeps that equation in check.

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Aligned to the Standards That Govern Automotive Reliability

AEC-Q100, JEDEC HTOL, and customer-defined reliability specifications define the qualification framework for automotive devices. Micro Control helps customers ensure their burn-in configuration and documentation are aligned with those requirements, so the process holds up at every stage, from internal review to supplier audit.

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Every Node Transition Deserves a Fresh Look

The stress conditions that were appropriate for a previous process node don’t automatically transfer to the next one. Leakage behavior, thermal characteristics, and dominant failure mechanisms all shift as process technology scales. Micro Control supports customers through those transitions with configuration reviews that ensure burn-in continues to do what it’s supposed to do.

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From Engineering to Full Production

Automotive burn-in devices often begin in engineering environments during device qualification and scale into production as volumes grow. Micro Control’s systems and engineering support are designed to work across both contexts, giving customers a consistent approach from qualification builds through ongoing production screening.

Burn-In With Test for Vehicles Built to Last

Micro Control supports automotive burn-in devices at every stage of the device lifecycle, from early qualification through full production screening.

Relevant Systems

HPB-6

A high-power burn-in with test system with individual temperature control per device, engineered for devices up to 1,000 watts. A turnkey automation solution that scales from a single cell to a full production line.

HPB-5C

The HPB-5C is an industry standard, one of Micro Control's most proven, versatile burn-in with test system trusted by manufacturers worldwide. Air-cooled with individual temperature control per device, it keeps testing floors running dependably across legacy and current production.

LC-FLEX

A flexible, LC-2-compatible burn-in with test system with individual temperature control for devices up to 50 watts. A custom adapter board runs BIBs from other systems and manufacturers, bridging past, current, and future requirements.

LC-3

The LC-3 system is a production-ready burn-in with test system for logic, mixed signal, analog, and memory devices. Combines dynamic burn-in with test, expanded power and temperature control, and cold burn-in capability in one platform.

LC-2 V Series

A burn-in with test system designed to maximize your existing board infrastructure. An adapter-based approach lowers cost-of-test, shortens design cycles, and runs legacy and next-generation hardware together.

Learn More About Our Burn-In Solutions For Automotive Devices