LC-2 V Series

High-Power Burn-In with Test System

50 W

Wattage

2012

System Released

1536

DUTs Per System

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Micro Control LC-2 industrial test system with two large doors, an integrated touchscreen display, and an external monitor on a swing-arm mount.

Production Burn-In and an Option to Add Refrigeration

The LC-2 V series plays a significant role in the market by providing burn-in for a variety of device types during the same burn-in cycle. It is uniquely designed to be adaptable to any manufacturer’s burn-in boards sized at 12.3 x 24 inches and easily incorporates test vectors written for another Micro Control burn-in system. By adding the refrigeration option, devices can be stressed at the optimum temperature, providing a full range of operating life conditions.

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Technical Specifications

POWER SPECIFICATIONS

Target DUT Wattage	20W (50W for fewer devices)
Available Power	5 supplies, 248A, 1,000W
Max Power per BIB	500W
High-Current Regulators	4 per BIB — 240W, 60A, 0.5V–9.5V (doubled with 256 I/O option)
Low-Current Regulators	1 per BIB — 40W, 8A, 0.4V–5.0V (doubled with 256 I/O option)

MEMORY & PATTERN CAPACITY

Vector Memory Depth	4M standard, 8M optional
Scan Mode Rep-Rate	10MHz
High-Frequency Clocks	1 clock, up to 210MHz, LVDS

SYSTEM CAPACITY & I/O

BIB Slots	64 (32 if 256 I/O option is used)
I/O Channels	128 formatted digital per BIB (up to 256, depending on BIB size and card cage option)
Test Resolution	10 ns (8 on-the-fly timing sets)
BIB Compatibility	Compatible with other manufacturers’ burn-in board designs

THERMAL MANAGEMENT

Temp Channels per BIB	24 individual
System DUT Capacity	1,536 temperature-controlled DUTs
Temperature Limit	150°C per DUT
Chamber Options	2 to 4 chambers, with or without refrigeration (-40°C standard refrigeration, -55°C with LN2)
Socket Cooling	Air-cooled chamber with heater per DUT

Micro Control LC-2 industrial testing system with an open chamber door displaying circuit boards, a touchscreen interface, and an attached computer workstation.

Expand Your Testing Capabilities With Cold Burn-In

While traditional burn-in systems only use heat, the LC-2 V-Series can lower chamber temperatures to test how microchips perform down to -40°C with regular refrigeration and -55°C with LN2. It also helps you meet strict automotive and military standards, which require electronics to survive harsh winter environments. By combining both hot and cold stress testing into a single platform, the LC-2 V-Series eliminates the need for separate cold-testing machines, saving floor space and shortening your overall test cycles.

A circuit board featuring ten square processor modules, each topped with a small metal heatsink and connected by black cables.

LC-2 Burn-In Boards

Designed by engineers and PCB designers experienced in multi-layer board layouts. Each LC-2 board is built for the device under test and the customer's specific requirements. The device size and complexity determine how many devices will fit per board.

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Micro Control Company electronic testing unit with a prominent hazardous voltage warning label on its top panel.

LC-2 PSS

A single-board (one-slot) system with the same test electronics and device cooling as a full LC-2. Primarily used for test development and board troubleshooting.

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Tall mobile storage rack with multiple horizontal shelving tiers on casters.

LC-2 Board Carts

A manually operated mobile cart for burn-in boards.

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Micro Control HPB-8 industrial testing system with two open testing racks, a control panel, and a mounted computer monitor and keyboard.

Standalone Automation

Individual automation modules that run on their own or attach to a single system, a way to add automated handling without committing to a full line. A flexible entry point that can grow into the complete setup.

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System Comparison

Compare up to three Micro Control solutions to quickly narrow your options and identify which burn-in system best aligns with your device requirements, testing environment, and performance goals.

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POWER SCALE

Power Scale

Max

PERFORMANCE SPECS

Target DUT Wattage

BIB slots

Individual Temperature Control Channels per BIB

System Capacity of Temperature Controlled DUTs

DUT Temperature Control Mechanism

APPLICATIONS

ASIC

Automotive

Communications

Defense

Reliability

Smartphones

Why Choose the LC-2 V Series

Hot And Cold In One Platform

The only system that adds cold burn-in, testing devices down to -40°C with refrigeration and -55°C with LN2.

Meets Automotive And Military Standards

Validates device performance in the harsh low-temperature environments those standards require.

Consolidated Test Floor

Eliminates the need for separate cold-testing machines, saving floor space and shortening test cycles.

High-Density, Flexible Configuration

1,536 temperature-controlled DUTs, with compatibility for other manufacturers’ board designs.

Featured Resources

Why Individual Temperature Control Burn-In

Burn-in with Individual temperature control (ITC) is the most important development in burn-in technology.

What is Burn-In?

Burn-in is the process that applies elevated temperatures and high voltages to accelerate conditions that will stress semiconductors during what is known as their infant mortality period.

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