Switches, routers, base stations, optical transport systems, and the semiconductor devices inside them are expected to operate reliably for five to ten years or more, frequently in remote or hard-to-service locations. Failures in these environments don’t just affect a single device; they affect the networks and services that depend on the hardware. Burn-in with test helps communications and networking devices reduce infant mortality by identifying latent defects before devices are installed in systems that power our modern communications infrastructure.
Key Specifications
- Supports qualification and production screening for networking semiconductor devices
- Applicable to switches, routers, optical transport, base stations, and edge computing platforms
- Addresses early-life failure risks associated with continuous operation under load
- Burn-in conditions selected based on device workload, power profile, and reliability targets