Applications / Communications & Networking

Communications & Networking

Networking infrastructure is expected to run continuously, often in locations where maintenance is difficult, and downtime is unacceptable. Burn-in with test supports the early-life screening that makes that level of reliability achievable.

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Switches, routers, base stations, optical transport systems, and the semiconductor devices inside them are expected to operate reliably for five to ten years or more, frequently in remote or hard-to-service locations. Failures in these environments don’t just affect a single device; they affect the networks and services that depend on the hardware. Burn-in with test helps communications and networking devices reduce infant mortality by identifying latent defects before devices are installed in systems that power our modern communications infrastructure.

Key Specifications

  • Supports qualification and production screening for networking semiconductor devices
  • Applicable to switches, routers, optical transport, base stations, and edge computing platforms
  • Addresses early-life failure risks associated with continuous operation under load
  • Burn-in conditions selected based on device workload, power profile, and reliability targets

Key Statistics

31%

Networking’s share of global semiconductor market

13%

Networking semiconductor growth rate in 2025

5–10+ Years

Typical networking hardware deployment life

Key Features & Benefits

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Downtime in Networking Has Operational and Financial Consequences

In carrier and enterprise networks, unplanned downtime affects services, users, and SLA compliance. Early-life device failures that could have been caught in production screening create the kind of emergency maintenance events that are costly, disruptive, and preventable. Burn-in with test shifts those discoveries to the right side of deployment.

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Long Operational Lifetimes Demand Confidence Up Front

Communications hardware is expected to remain in service for years, often in environments where physical replacement requires significant planning and expense. The confidence that burn-in provides at the beginning of a device’s life pays dividends across its entire operational lifetime, saving your organization time, cost, and headaches long into the future throughout the life of the devices.

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Sustained Electrical Load Is the Point

Networking devices don’t operate in bursts; they run continuously, under sustained electrical load, for years at a time. Burn-in mirrors that reality by applying extended electrical and thermal stress that short-duration tests simply can’t replicate. Sustained exposure provides a more realistic testing environment that surfaces the marginal behaviors and latent defects that are most likely to cause problems in the field after deployment.

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Thermal Stability Under Continuous Load

Networking devices generate significant heat under sustained traffic loads, and thermal behavior that looks acceptable during short-duration testing can become a reliability risk under continuous operation. Burn-in with test applies controlled thermal stress alongside electrical stress, surfacing heat-related marginal conditions, junction sensitivity, packaging stress, and thermal impedance variation, before devices are installed in systems that never get a break.

Burn-In With Test for Always-On Infrastructure

From device qualification to volume production screening, Micro Control supports burn-in with test devices for the semiconductor devices that keep the world’s communications networks running.

Relevant Systems

HPB-8

Micro Control's most powerful burn-in with test system, with individual temperature control per device and capacity for devices over 2,000 watts. Built as a standalone automation solution for AI, automotive, and advanced semiconductor production.

HPB-6

A high-power burn-in with test system with individual temperature control per device, engineered for devices up to 1,000 watts. A turnkey automation solution that scales from a single cell to a full production line.

HPB-5C

The HPB-5C is an industry standard, one of Micro Control's most proven, versatile burn-in with test system trusted by manufacturers worldwide. Air-cooled with individual temperature control per device, it keeps testing floors running dependably across legacy and current production.

Learn More About Our Burn-In Solutions For Communications Devices