Defense and aerospace semiconductor devices operate in some of the harshest environments imaginable: extreme temperatures, vibration, radiation, altitude, and continuous operation over years or even decades. And in most cases, if something fails after deployment, the options for repair or replacement are limited or nonexistent. Burn-in with test plays a role in defense and aerospace reliability devices by helping identify latent device-level defects before components are integrated into systems where a single failure can compromise a mission or endanger a crew.
Key Specifications
- Applied during device qualification, production screening, and long-duration reliability evaluation
- Supports MIL-STD and customer-defined qualification requirements
- Applicable to avionics, navigation, radar, communications, and space systems
- Burn-in strategies tailored to device criticality, operating environment, and device requirements