LC-FLEX BIB Cart for Burn-In with Test
A manually operated mobile cart for securely transporting BIBs between your LC-FLEX systems and EDS.
A manually operated mobile cart for securely transporting BIBs between your LC-FLEX systems and EDS.
| PCB Size | 12.3” x 24” (312.4 mm x 609.6 mm) |
| DUT Area / User Space | 6.7” x 22.8” (170.1 mm x 579.1 mm) |
| Number of Devices | Up to 84 depending on size & complexity |
| Sockets | High-temp, user specified |
| Cooling Method | User specified |
| PCB Size | 22.2” x 24” (563.9 mm x 609.6 mm) |
| DUT Area / User Space | 16.6” x 22.8” (421.6 mm x 579.1 mm) |
| Number of Devices | Up to 84 depending on size & complexity |
| Sockets | High-temp, user specified |
| Cooling Method | User specified |
A flexible, LC-2-compatible burn-in with test system with individual temperature control for devices up to 50 watts. A custom adapter board runs BIBs from other systems and manufacturers, bridging past, current, and future requirements.
Designed by engineers and PCB designers experienced in multi-layer board layouts. Each LC-FLEX board is designed for the device under test and the customer's specific requirements. The device size and complexity determine how many fit per board.
A single-board (one-slot) system with the same test electronics and device cooling as a full LC-FLEX. Primarily used for test development and board troubleshooting.
A connected complete setup of automated loading, mobile robotics, and burn-in systems working as one. Cross platform software synchronizes every handoff, scaling from a single cell to full production.
Burn-in with Individual temperature control (ITC) is the most important development in burn-in technology.
Burn-in is the process that applies elevated temperatures and high voltages to accelerate conditions that will stress semiconductors during what is known as their infant mortality period.
Get The Complete Turnkey Solution For The LC-FLEX